Donggun Park, : rechercher sur Z-Library

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1

Operation Procedures of a Work-Center-Level Digital Twin for Sustainable and Smart Manufacturing

Park, Kyu Tae, Lee, Donggun, Noh, Sang Do

Journal:

International Journal of Precision Engineering and Manufacturing-Green Technology

Année:

2020

Fichier:

PDF, 6.49 MB

2020

2

[IEEE Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Notre Dame, IN, USA (June 21-23, 2004)] Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Three-dimensional multi-bridge-channel MOSFET (MBCFET) fabricated on bulk Si-substrate

Sung-Young Lee,, Eun-Jung Yoon,, Sung-Min Kim,, Chang Woo Oh,, Ming Li,, Dong-Won Kim,, Ilsub Chung,, Donggun Park,, Kinam Kim,

Année:

2004

Langue:

english

Fichier:

PDF, 167 KB

english, 2004

3

The prospect of process-induced charging damage in future thin gate oxides

Donggun Park, Chenming Hu

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 294 KB

english, 1999

4

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Silicon nanowire CMOSFETs : Fabrication, characteristics, and memory application

Année:

2008

Langue:

english

Fichier:

PDF, 7.74 MB

english, 2008

5

Experimental Investigations on Carrier Transport in Si Nanowire Transistors: Ballistic Efficiency and Apparent Mobility

Runsheng Wang, Hongwei Liu, Ru Huang, Jing Zhuge, Liangliang Zhang, Dong-Won Kim, Xing Zhang, Donggun Park, Yangyuan Wang

Journal:

IEEE Transactions on Electron Devices

Année:

2008

Langue:

english

Fichier:

PDF, 779 KB

english, 2008

6

[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Evaluation of Ultra Thin Body Si-On-ONO (UTB SOONO) transistors using ultra thin spacer technology

Hyun Jun Bae,, Sung Hwan Kim,, Sung In Hong,, Yong Lack Choi,, Ho Ju Song,, Chang Woo Oh,, Dong-Won Kim,, Park, Donggun, KyungSeok Oh,, Won-Seong Lee,

Année:

2008

Langue:

english

Fichier:

PDF, 386 KB

english, 2008

7

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - A novel sub-50 nm multi-bridge-channel MOSFET (MBCFET) with extremely high performance

Sung-Young Lee,, Eun-Jung Yoon,, Sung-Min Kim,, Chang Woo Oh,, Ming Li,, Jeong-Dong Choi,, Kyoung-Hwan Yeo,, Min-Sang Kim,, Hye-Jin Cho,, Sung-Hwan Kim,, Dong-Won Kim,, Donggun Park,, Kina

Année:

2004

Langue:

english

Fichier:

PDF, 209 KB

english, 2004

8

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Sub-25nm single-metal gate CMOS multi-bridge-channel MOSFET (MBCFET) for high performance and low power application

Sung-Young Lee,, Eun-Jung Yoon,, Dong-Suk Shin,, Sung-Min Kim,, Sung-Dae Suk,, Min-Sang Kim,, Dong-Won Kim,, Donggun Park,, Kinam Kim,, Byung-il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 932 KB

english, 2005

9

Nanoscale Phenomena in Lithium-Ion Batteries

Jung, Sung-Kyun, Hwang, Insang, Chang, Donghee, Park, Kyu-Young, Kim, Sung Joo, Seong, Won Mo, Eum, Donggun, Park, Jooha, Kim, Byunghoon, Kim, Jihyeon, Heo, Jae Hoon, Kang, Kisuk

Journal:

Chemical Reviews

Année:

2019

Fichier:

PDF, 37.14 MB

2019

10

A Novel Method to Achieve Selective Emitter Using Surface Morphology for PERC Silicon Solar Cells

Ju, Minkyu, Park, Jeongeun, Cho, Young Hyun, Kim, Youngkuk, Lim, Donggun, Cho, Eun-Chel, Yi, Junsin

Journal:

Année:

2020

Fichier:

PDF, 5.62 MB

2020

11

Effect of glue on reliability of flip chip BGA packages under thermal cycling

Tung T. Nguyen, Donggun Lee, Jae B. Kwak, Seungbae Park

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2010

12

Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide

Chihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee

Journal:

Microelectronics Reliability

Année:

2003

Langue:

english

Fichier:

PDF, 313 KB

english, 2003

13

Characteristics of the full CMOS SRAM cell using body-tied TG MOSFETs (bulk FinFETs)

Tai-Su Park, Hye Jin Cho, Jeong Dong Choe, Sang Yeon Han, Donggun Park, Kinam Kim, Yoon, E., Jong-Ho Lee

Journal:

IEEE Transactions on Electron Devices

Année:

2006

Langue:

english

Fichier:

PDF, 707 KB

english, 2006

14

Structural and electrical properties of co-evaporated Cu(In,Ga)Se2 thin films with varied Cu contents

Kim, Min Young, Kim, Girim, Kim, Jongwan, Park, Jae Hwan, Lim, Donggun

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 442 KB

english, 2013

15

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells

Jae-Duk Lee,, Jeong-Hyuk Choi,, Donggun Park,, Kinam Kim,

Année:

2003

Langue:

english

Fichier:

PDF, 305 KB

english, 2003

16

Curcumin Could Prevent the Development of Chronic Neuropathic Pain in Rats with Peripheral Nerve Injury

Jeon, Younghoon, Kim, Chae-Eun, Jung, Dongho, Kwak, Kyunghwa, Park, Sungsik, Lim, Donggun, Kim, Sioh, Baek, Woonyi

Journal:

Current Therapeutic Research

Année:

2013

Langue:

english

Fichier:

PDF, 273 KB

english, 2013

17

Characteristics of aluminum-doped zinc oxide films with oxygen plasma treatment for solar cell applications

Park, Yong Seob, Seo, Munsoo, Yi, Junsin, Lim, Donggun, Lee, Jaehyeong

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 771 KB

english, 2013

18

Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs

Jin-Woo Han,, Choong-Ho Lee,, Donggun Park,, Yang-Kyu Choi,

Journal:

IEEE Electron Device Letters

Année:

2006

Langue:

english

Fichier:

PDF, 122 KB

english, 2006

19

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - New Observations on the Hot Carrier and NBTI Reliability of Silicon Nanowire Transistors

Wang, Runsheng, Huang, Ru, Kim, Dong-Won, He, Yandong, Wang, Zhenhua, Jia, Gaosheng, Park, Donggun, Wang, Yangyuan

Année:

2007

Langue:

english

Fichier:

PDF, 1.72 MB

english, 2007

20

[IEEE 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - Austin, TX, USA (2005.05.11-2005.05.11)] 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - The application of BT-FinFET technology for sub 60nm DRAM integration

Choong-Ho Lee,, Jac-Man Yoon,, Chul Lee,, Keunnam Kim,, Seung Bae Park,, Young Joon Ann,, Hee Soo Kang,, Donggun Park,

Année:

2005

Langue:

english

Fichier:

PDF, 582 KB

english, 2005

21

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Flicker noise in N-type and P-type silicon nanowire transistors

Yang, Seungwon, Son, Younghwan, Suk, Sung Dae, Kim, Dong-Won, Park, Donggun, Oh, Kyungseok, Shin, Hyungcheol

Année:

2008

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2008

22

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Hot carrier generation and reliability of BT(body-tied)-fin type SRAM cell transistors (W/sub fin/=20~70nm)

Young Jomi Ahn,, Hye Jin Cho,, Hee Soo Kang,, Choong-Ho Lee,, Choi Lee,, Jac-man Yoon,, Tac Yong Kim,, Eno Suk Cho,, Suk-Kang Sung,, Donggun Park,, Kinam Kim,, Byung-Il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 574 KB

english, 2005

23

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Temperature dependent transport characteristics of multi-bridge-channel MOSFETs (MBCFETs)

YoungChai Jung,, KeunHwi Cho,, ByoungHak Hong,, SuHeon Hong,, SungWoo Hwang,, Ahn, D., Sung-Young Lee,, Min-Sang Kim,, Eun-Jung Yoon,, Dong-Won Kim,, Donggun Park,

Année:

2007

Langue:

english

Fichier:

PDF, 335 KB

english, 2007

24

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Enhanced ion implantation charging damage on thin gate oxide due to photoresist

Donggun Park,, Chenming Hu,

Année:

1997

Langue:

english

Fichier:

PDF, 269 KB

english, 1997

25

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Sub-20nm Surrounding-Gate Bridge-Channel MOSFETs for Low Power and High Performance Applications

Yun, Eun Jung, Lee, Sung-Young, Kim, Min Sang, Kim, Sung Min, Choi, Inhyuk, Lee, Jimyoung, Park, Bork Kyoung, Kim, Dong-Won, Park, Donggun

Année:

2007

Langue:

english

Fichier:

PDF, 2.34 MB

english, 2007

26

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Characteristics of MBCFET (Multi-Bridge-Channel MOSFET) with Tall-Embedded-Gate (TEG)

Yun, Eun, Kim, Min, Kim, Sung, Lee, Sung-young, Kim, Dong-won, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 371 KB

english, 2006

27

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Effects of RTA and WSi/sub x/-polycide gate processes on MOSFET reliability for giga-bit scale DRAMs

Donggun Park,, Nak-Jin Son,, Ji-Young Kim,, Wonshik Lee,

Année:

2000

Langue:

english

Fichier:

PDF, 319 KB

english, 2000

28

Outage Probability and Outage-Based Robust Beamforming for MIMO Interference Channels with Imperfect Channel State Information

Park, Juho, Sung, Youngchul, Kim, Donggun, Poor, H. Vincent

Journal:

IEEE Transactions on Wireless Communications

Année:

2012

Langue:

english

Fichier:

PDF, 531 KB

english, 2012

29

[IEEE 2016 First IEEE International Conference on Computer Communication and the Internet (ICCCI) - Wuhan, China (2016.10.13-2016.10.15)] 2016 First IEEE International Conference on Computer Communication and the Internet (ICCCI) - New automatic de-registration method utilizing a timer in the IEEE802.1 TSN

Park, Donggun, Lee, Juho, Park, Culsun, Park, Sungkwon

Année:

2016

Langue:

english

Fichier:

PDF, 407 KB

english, 2016

30

Characterization of ZnS Thin Films Grown Using Chemical Bath Deposition with Three Different Complexing Agents

Park, Sang Yong, Park, Jeong Eun, Eom, Taewoo, Park, Jeong Hun, Bweupe, Jackson, Lim, Donggun

Journal:

Journal of Nanoscience and Nanotechnology

Année:

2018

Langue:

english

Fichier:

PDF, 4.63 MB

english, 2018

31

[IEEE 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Waikoloa Village, HI (2018.6.10-2018.6.15)] 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Effect of Rear Passivation and Local Back Contact for High Efficiency c-Si Solar Cell with Variable Laser Feed Speed

Cho, Young Ho, Park, Jeong Eun, Kang, Sangmuk, Hong, Hye Kwan, Kim, Dong Sik, Han, Chang-Soon, Lim, Donggun

Année:

2018

Fichier:

PDF, 6 KB

2018

32

B8-1ãAn Analysis of Characteristics of Korean Females' Lower Body Shape Using Fuzzy Logic and Classification Methods

Ahn, Sung Hee, Park, Donggun, Sim, Hyung Min, Ling, Cherry Yieng Siang, Yun, Myung Hwan

Année:

2017

Fichier:

PDF, 733 KB

2017

33

Scalable 2-bit silicon–oxide–nitride–oxide–silicon (SONOS) memory with physically separated local nitrides under a merged gate

Yong Kyu Lee, Suk Kang Sung, Jae Sung Sim, Ki Whan Song, Jong Duk Lee, Byung-Gook Park, Sung Taeg Kang, Chilhee Chung, Donggun Park, Kinam Kim

Journal:

Solid-State Electronics

Année:

2004

Langue:

english

Fichier:

PDF, 485 KB

english, 2004

34

NEMS switch with 30 nm-thick beam and 20 nm-thick air-gap for high density non-volatile memory applications

Weon Wi Jang, Jun-Bo Yoon, Min-Sang Kim, Ji-Myoung Lee, Sung-Min Kim, Eun-Jung Yoon, Keun Hwi Cho, Sung-Young Lee, In-Hyuk Choi, Dong-Won Kim, Donggun Park

Journal:

Solid-State Electronics

Année:

2008

Langue:

english

Fichier:

PDF, 506 KB

english, 2008

35

25-nm programmable virtual source/drain MOSFETs using a twin SONOS memory structure

Woo Young Choi, Byung Yong Choi, Dong-Won Kim, Choong-Ho Lee, Donggun Park, Jong Duk Lee, Byung-Gook Park

Journal:

Solid-State Electronics

Année:

2006

Langue:

english

Fichier:

PDF, 438 KB

english, 2006

36

2,3,7,8-TCDD neurotoxicity in neuroblastoma cells is caused by increased oxidative stress, intracellular calcium levels, and tau phosphorylation

Donggun Sul, Hyo-Shin Kim, Eun-Kyung Cho, Min Lee, Hyun Sook Kim, Woon-Won Jung, Kwang Woo Hwang, So-Young Park

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 546 KB

english, 2009

37

Impact of time dependent dielectric breakdown and stress-induced leakage current on the reliability of high dielectric constant (Ba,Sr)TiO3 thin-film capacitors for Gbit-scale DRAMs

Yamamichi, S., Yamamichi, A., Donggun Park, Tsu-Jae King, Chenming Hu

Journal:

IEEE Transactions on Electron Devices

Année:

1999

Langue:

english

Fichier:

PDF, 223 KB

english, 1999

38

A unique dual-poly gate technology for 1.2-V mobile DRAM with simple in situ n+-doped polysilicon

Nak-Jin Son, Yongchul Oh, Wookje Kim, Jang, S.-M., Wouns Yang, Gyoyoung Jin, Donggun Park, Kinam Kim

Journal:

IEEE Transactions on Electron Devices

Année:

2004

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2004

39

Quasi 3-D Velocity Saturation Model for Multiple-Gate MOSFETs

Jin-Woo Han, Choong-Ho Lee, Donggun Park, Yang-Kyu Choi

Journal:

IEEE Transactions on Electron Devices

Année:

2007

Langue:

english

Fichier:

PDF, 355 KB

english, 2007

40

Negative-Bias Temperature Instability in Gate-All-Around Silicon Nanowire MOSFETs: Characteristic Modeling and the Impact on Circuit Aging

Changze Liu, Tao Yu, Runsheng Wang, Liangliang Zhang, Ru Huang, Dong-Won Kim, Donggun Park, Yangyuan Wang

Journal:

IEEE Transactions on Electron Devices

Année:

2010

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2010

41

Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization

Runsheng Wang, Jing Zhuge, Ru Huang, Tao Yu, Jibin Zou, Dong-Won Kim, Donggun Park, Yangyuan Wang

Journal:

IEEE Transactions on Electron Devices

Année:

2011

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2011

42

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Novel body tied FinFET cell array transistor DRAM with negative word line operation for sub 60nm technology and beyond

Lee, C.H., Yoon, J.M., Lee, C., Yang, H.M., Kim, K.N., Kim, T.Y., Kang, H.S., Ahn, Y.J., Donggun Park,, Kinam Kim,

Année:

2004

Langue:

english

Fichier:

PDF, 196 KB

english, 2004

43

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Test structure for performance evaluation of 3 dimensional FinFETs

Young Joon Ahn,, Hye Jin Cho,, Hee Soo Kang,, Choong-Ho Lee,, Chul Lee,, Jae-man Yoon,, Tae Yong Kim,, Eun Suk Cho,, Suk-kang Sung,, Donggun Park,, Kinam Kim,, Byung-Il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 540 KB

english, 2005

44

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications

Oh, Chang Woo, Kim, Na Young, Song, Ho Ju, Hong, Sung In, Kim, Sung Hwan, Choi, Yong Lack, Bae, Hyun Jun, Choi, Dong Uk, Lee, Yong Seok, Kim, Dong-Won, Park, Donggun, Ryu, Byung-Il

Année:

2007

Langue:

english

Fichier:

PDF, 4.12 MB

english, 2007

45

[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Performance Enhancement for Ultra Thin Body MOSFETs Using Ultra Thin Spacer

Kim, Sung, Oh, Chang, Hong, Sung, Choi, Yong, Kim, Na, Bae, Hyun, Lee, Ji-hyun, Lee, Kong, Yoon, Je, Kim, Dong-won, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 2.11 MB

english, 2006

46

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Highly Manufacturable TiN Metal Gate Nanorod Transistors Realized on Silicon-On-ONO (SOONO) Substrate

Kim, Sung Hwan, Oh, Chang Woo, Choi, Yong Lack, Hong, Sung-In, Kim, Na Young, Bae, Hyun Jun, Kim, Sung-Han, Park, Heung Sik, Yoon, Je Bum, Park, Im Soo, Kim, Dong-Won, Park, Donggun, Ryu, Byung-Il

Année:

2006

Langue:

english

Fichier:

PDF, 521 KB

english, 2006

47

Effects of Substitution of K2O for Na2O on the Bioactivity of CaO-Na2O-SiO2-P2O5glasses

Taehee Kim, Chawon Hwang, Donggun Gwoo, Hoyyul Park, Bong-Ki Ryu

Journal:

Electronic Materials Letters

Année:

2012

Langue:

english

Fichier:

PDF, 486 KB

english, 2012

48

[IEEE 2011 IEEE Global Communications Conference (GLOBECOM 2011) - Houston, TX, USA (2011.12.5-2011.12.9)] 2011 IEEE Global Telecommunications Conference - GLOBECOM 2011 - Sum Outage-Rate Maximization for MIMO Interference Channels

Juho Park,, Donggun Kim,, Youngchul Sung,

Année:

2011

Langue:

english

Fichier:

PDF, 202 KB

english, 2011

49

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Retention Reliability of FinFET SONOS Device

Lee, Jong, Lee, Se, Chae, Heesoon, Choi, Byung, Sung, Suk-kang, Kim, Seok, Cho, Eun, Lee, Choong, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 558 KB

english, 2006

50

Fully integrated SONOS flash memory cell array with BT (body tied)-FinFET structure

Suk-Kang Sung,, Tae-Yong Kim,, Eun Suk Cho,, Hye Jin Cho,, Byung Yong Choi,, Chang Woo Oh,, Byung-Kyu Cho,, Choong-Ho Lee,, Donggun Park,

Journal:

IEEE Transactions on Nanotechnology

Année:

2006

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2006